• High-precision XRD — ultra-accurate angular positioning (≤ ±0.01° 2θ) for powder, thin films, and coatings.

  • Modular optics system — switchable Bragg-Brentano, parallel beam, and TWIN/TRIO optics without manual alignment.

  • Advanced detectors — options like LYNXEYE XE-T for energy-resolved, high-speed data acquisition.

  • Versatile sample handling — supports powders, bulk solids, thin films, liquids, and special sample stages.

  • Integrated software suite — DIFFRAC.SUITE, TOPAS, and other modules for analysis, pattern matching, and reporting.

  • Scalable & upgradeable — add thin-film, residual stress, or non-ambient modules; suitable for research or industrial labs.

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